Model Sensitivity Evaluation and Dielectric Constant Measurement Uncertainty Reduction

The Thesis is devoted to the evaluation of the dielectric constant measurement model’s suitability for the characterization of high-frequency low-loss dielectric materials and the design of models providing small uncertainty in the case conventional models cannot accomplish it. The measurement models investigated in the Thesis involve flat dielectric samples in a rectangular waveguide or free-space and cylindrical dielectric full-height samples in a rectangular waveguide. The measurement uncertainty is estimated using two international standard recommended methods, namely, the Error Propagation Method and Monte Carlo Method.